Month: February 2019

CPPR Project Reveals Nanometer-Scale Residual Crystals in Hot Melt Extrudates

Dana Moseson, graduate student in Lynne Taylor’s lab at Purdue University describe the characterization of residual crystallinity in hot melt extrudates down to the nanometer-scale using a suite of techniques.  See Moseson DE, Mugheirbi NA, Stewart AA, Taylor LS. Nanometer-Scale Residual Crystals in a Hot Melt Extruded Amorphous Solid Dispersion: Characterization by Transmission Electron Microscopy. Crystal Growth & Design. 2018 Oct 26;18(12):7633-40.